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Member of:
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Improve your
Metrolog CMM with
high speed OptiScan
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Supplied
with:
Scanlink Metrolog
interface |
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Metrolog XG and DATAPIXEL
OptiScan open the door for virtual
metrology based on optical scanning,
offering an innovative concept
of virtual probing process over
clouds of points and the comparison
of colour maps with CAD reference. |
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The
possibilities for the CMM users are
immense:
- High speed capture of points (more
than 60.000 points/sec)
- Optical scanning measurement of surfaces
and geometries
- Virtual probing tools over cloud
of points
- High speed optical measurement of
profiles and sections
- Comparison of colour points cloud
maps against CAD
- Multisensor possibility by indistinctly
using classic tactile probes with DATAPIXEL
optical sensors.
- Automatic DATAPIXEL sensors calibration
- Accuracy improvement by using all
the Metrolog XG compensation tools
- Total compatibility with Renishaw
heads
- on-line / off-line programming with
DATAPIXEL sensors
- Previsualization of measurement points
- Reports exportation to different
formats (DMIS, VDAFS, IGES, ASCII,
Excel...)
- Compatibility with a big range of
CMM, whether manual CMM or CNC. |
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OptiScan H-Class Package for Metrolog,
All you need to transform
your CMM in a powerful high speed scanning device:
H-Class for Metrolog package integrated by OptiScan
H-1040-L optical probe, OptiScan HCU-1000 control
unit, cable set to CMM, Scanlink Metrolog software,
User manual and calibration sphere.
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