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  Improve your Metrolog CMM with high speed OptiScan
 
  Supplied with:
Scanlink Metrolog interface
 
  1 year guarantee  





 
 Metrolog XG and DATAPIXEL OptiScan open the door for virtual metrology based on optical scanning, offering an innovative concept of virtual probing process over clouds of points and the comparison of colour maps with CAD reference.
The possibilities for the CMM users are immense:

- High speed capture of points (more than 60.000 points/sec)
- Optical scanning measurement of surfaces and geometries
- Virtual probing tools over cloud of points
- High speed optical measurement of profiles and sections
- Comparison of colour points cloud maps against CAD
- Multisensor possibility by indistinctly using classic tactile probes with DATAPIXEL optical sensors.
- Automatic DATAPIXEL sensors calibration
- Accuracy improvement by using all the Metrolog XG compensation tools
- Total compatibility with Renishaw heads
- on-line / off-line programming with DATAPIXEL sensors
- Previsualization of measurement points
- Reports exportation to different formats (DMIS, VDAFS, IGES, ASCII, Excel...)
- Compatibility with a big range of CMM, whether manual CMM or CNC.
 

OptiScan H-Class Package for Metrolog,


All you need to transform your CMM in a powerful high speed scanning device:
H-Class for Metrolog package integrated by OptiScan H-1040-L optical probe, OptiScan HCU-1000 control unit, cable set to CMM, Scanlink Metrolog software, User manual and calibration sphere.
 
info@datapixel.com