Great success of Innovalia Metrology at Control Fair
Innovalia Metrology presented Ms Portable and its latest products and solutions at Control Fair, held in Stuttgart, from 14 to 17 May. The metrological unit of Innovalia had a booth in the Hall 5, stand 5120, where visitors found the latest developments and metrological solutions suitable for areas such as rail, aeronautics, automotion and wind industry.
During the Fair, we gave the following presentation in our booth:
Tetrachek CMM: An innovative system developed by Innovalia Metrology for quick system-testing, specially designed for immediate checking of three-dimensional machine state and linear errors evolution.
M3 Experience: An exclusive group of experts participating in the development of a new generation of tools for digital production and quality management.
Metromeet: The only European Conference on Industrial Dimensional Metrology, consolidated after 9 editions as a forum for debate on metrology and its development in a fast changing industry.