Innovalia Metrology, at enovaParis 2013

Professionals of aeronautics and automotive industry showed great interest in Innovalia Metrology’s products and developments during enovaParis 2013 fair, which has put together more than 5000 visitors at the French capital on 17, 18 and 19 September.

Innovalia Metrology presented M3 Portable, the new high accuracy scanning system, equipped with M3 platform (Multisensor Massive Measurement), that optimizes the management of measurement processes naturally and efficiently. The combination between M3 Portable and M3 has established itself as an ideal solution for industrial control, being on the one hand a fully automatic, on the other hand offering the versatility of portability.

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