Great success of Innovalia Metrology products at the BIEMH

The booth of Innovalia Metrology is receiving a large and constant influx of visitors during the Machine Tool Biennial, held in Bilbao (Spain) from 28th May to 2nd June. Innovalia Metrology presented the new M3 Platform (Multisensor Massive Measurement), the new paradigm of dimensional control that allows you to optimize the management of your measurement processes naturally and efficiently.